X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 250 uM DdrC 140 mM Sodium sulfate 14 mM Sodium citrate 3.6% (w/v) PEG 8000 4.3% (v/v) Pentaerythritol ethoxylate (3/4 EO/OH) 18 mM HEPES/NaOH, pH 7.5
Unit Cell:
a: 66.698 Å b: 66.698 Å c: 129.581 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 41
Crystal Properties:
Matthew's Coefficient: 2.84 Solvent Content: 56.63
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 2.24 59.30 26336 2512 96.29 0.2314 0.2498 66.54
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.239 66.698 96.8 0.055 ? 19.1 10.1 ? 26343 ? ? 54.41
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.239 2.278 99.9 ? ? 2.3 5.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08B1-1 0.9795 CLSI 08B1-1
Software
Software Name Purpose Version
PHENIX refinement 1.19.2_4158
autoPROC data reduction 1.0.5
autoPROC data scaling 1.0.5
AutoSol phasing 1.19.2_4158