X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 289 PEG 4000, sodium acetate, ammonium acetate
Unit Cell:
a: 29.608 Å b: 36.931 Å c: 68.513 Å α: 73.414° β: 83.918° γ: 66.059°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.00 Solvent Content: 38.42
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.08 27.06 101916 2003 93.11 0.2002 0.2131 14.94
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.079 27.06 93.4 0.060 ? 33.3 3.8 ? 101925 ? ? 11.00
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.08 1.1 89.4 ? ? 3.3 3.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.97872 APS 21-ID-F
Software
Software Name Purpose Version
PHENIX refinement 1.14_3260
PHENIX refinement 1.14_3260
HKL-2000 data reduction .
HKL-2000 data scaling .
PHASER phasing .