X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298 0.1 M HEPES, 8% ethylene glycol and 10% PEG 8000 at pH 7.5
Unit Cell:
a: 84.110 Å b: 88.680 Å c: 109.610 Å α: 106.610° β: 90.160° γ: 102.760°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.34 Solvent Content: 63.16
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.2500 52.3900 42524 2134 91.4700 0.2572 0.2824 121.5343
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.250 82.670 91.900 0.123 ? 5.700 3.700 ? 42715 ? ? 109.370
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.250 3.370 93.300 ? ? ? 3.700 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 1.00 APS 24-ID-E
Software
Software Name Purpose Version
MOSFLM data reduction v 7.3.0
Aimless data scaling v 0.7.4
PHASER phasing v 2.8.3
PHENIX refinement v 1.20.1-4887-000
PDB_EXTRACT data extraction v 3.24