ELECTRON MICROSCOPY

Sample

Single subunit of helical meprin alpha in the active state

Specimen Preperation
Sample Aggregation State FILAMENT
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details 3 s blot, -3 force
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 233660
Reported Resolution (Å) 2.6
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 44.5
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 500
Maximum Defocus (nm) 1500
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 130000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION crYOLO 1.8.1
IMAGE ACQUISITION EPU ?
CTF CORRECTION CTFFIND 4.1.13
CTF CORRECTION Warp 1.0.7
MODEL FITTING ISOLDE 1.1.0
MODEL FITTING UCSF ChimeraX 1.3
MODEL FITTING UCSF Chimera 1.13
MODEL FITTING Coot 0.9.2
INITIAL EULER ASSIGNMENT RELION 2.1, 3.1
FINAL EULER ASSIGNMENT cryoSPARC 3.3.1
FINAL EULER ASSIGNMENT RELION 3.1
CLASSIFICATION RELION 3.1
MODEL REFINEMENT ISOLDE 1.1.0
MODEL REFINEMENT PHENIX 1.17
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?