X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 286 0.2 M sodium chloride, 0.1 M Bis-Tris, pH 5.5, 25% PEG3350
Unit Cell:
a: 40.846 Å b: 54.613 Å c: 71.464 Å α: 90.000° β: 102.190° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.17 Solvent Content: 43.20
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.5500 39.9200 8509 851 83.8200 0.1948 0.2431 25.3151
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.550 39.920 84.200 0.410 ? 20.200 47.600 ? 8552 ? ? 5.800
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.550 2.660 35.100 ? ? ? 29.100 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL12-1 1.73816 SSRL BL12-1
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.7.4
SOLVE phasing .
RESOLVE model building .
PHENIX refinement 1.19.2-4158
PDB_EXTRACT data extraction 3.27