X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 291 2 M sodium formate, 100 mM MES, 5% (w/v) PEG 5000 MME
Unit Cell:
a: 122.136 Å b: 122.136 Å c: 122.136 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 41 3 2
Crystal Properties:
Matthew's Coefficient: 3.24 Solvent Content: 62.08
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.9000 38.6230 25124 1274 99.9600 0.1927 0.2312 37.2703
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.900 49.860 100.000 0.145 ? 12.500 19.400 ? 25182 ? ? 33.390
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.900 1.940 100.000 ? ? ? 20.100 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.0000 APS 17-ID
Software
Software Name Purpose Version
PHENIX refinement dev_3111
XDS data reduction .
Aimless data scaling 0.6.3
PDB_EXTRACT data extraction 3.27
CRANK2 phasing .
PHASER phasing .