X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 291 Index A4: 2.0 M Ammonium sulfate, 0.1 M BIS-TRIS, KlpnC.20504.a.B1.PW39083 at 40 mg/mL, Tray: plate 12369 well A4 drop 1, Puck: PSL0616, Cryo: 80% crystallant + 20% glycerol
Unit Cell:
a: 63.138 Å b: 63.279 Å c: 131.599 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.11 Solvent Content: 41.62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.6500 45.5600 64076 3088 99.7800 0.1779 0.2050 25.8344
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.650 65.800 99.900 0.076 ? 12.400 5.900 ? 64185 ? ? 21.110
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.650 1.690 99.900 ? ? ? 6.200 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 19-ID 0.9840 NSLS-II 19-ID
Software
Software Name Purpose Version
XDS data reduction .
Aimless data scaling 0.7.7
PHASER phasing 2.8.3
PHENIX refinement 1.19.2_4158
PDB_EXTRACT data extraction 3.27
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