X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 298 15% PEG 4000, 40 mM potassium phosphate dibasic pH 7.5, 20% glycerol
Unit Cell:
a: 112.608 Å b: 137.613 Å c: 138.023 Å α: 60.750° β: 87.160° γ: 68.400°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.81 Solvent Content: 56.15
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.5000 63.8800 62203 1988 74.3300 0.2035 0.2726 113.2813
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.5 63.88 74.7 ? 0.184 4.8 3.1 ? 62204 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.5 3.62 ? ? 1.150 1.2 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 1.0100 ALS 5.0.2
Software
Software Name Purpose Version
XDS data reduction .
SCALA data scaling .
PHASER phasing .
PHENIX refinement 1.17.1_3660
PDB_EXTRACT data extraction 3.27