X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.7 287 Optimization condition around Anatrace/Calibre MCSG1 screen D9: 100mM Tris Base/HCl pH 8.7, 28% PEG 3350, 200mM NaCl: KlpnC.00980.a.B1.PW39015 at 27mg/ml + 3.5mM PLP: tray 323619 g9: cryo: 20% EG+ 2.5mM PLP in 2 steps, puck: bid6-5.
Unit Cell:
a: 55.210 Å b: 80.660 Å c: 86.820 Å α: 90.000° β: 104.065° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.31 Solvent Content: 46.8
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD FREE R-VALUE 1.50 44.62 117496 2021 99.61 0.1290 0.1602 18.63
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.500 50 99.600 0.032 ? 53.850 16.407 ? 117524 ? ? 21.155
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.500 1.540 96.400 ? ? 4.660 8.359 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E+ SUPERBRIGHT 1.5418 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.20 4438
XDS data reduction .
XSCALE data scaling .
PDB_EXTRACT data extraction 3.27
SHELXDE phasing .
Coot model building .
SHELXE model building .