ELECTRON MICROSCOPY

Sample

GPC2 HET CT3 complex

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument
Cryogen Name
Sample Vitrification Details
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 21000
Reported Resolution (Å) 21
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol ?
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type FEI EAGLE (2k x 2k)
Electron Dose (electrons/Å2) 40
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TECNAI 20
Minimum Defocus (nm) 2000
Maximum Defocus (nm) 5000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model ?
Nominal Magnification 100000
Calibrated Magnification ?
Source LAB6
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION SerialEM ?
INITIAL EULER ASSIGNMENT RELION 3.08
FINAL EULER ASSIGNMENT RELION 3.08
CLASSIFICATION RELION 3.08
RECONSTRUCTION RELION 3.08
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
NONE ?