X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 20% w/v polyethylene glycol 3350, 0.2 M Potassium thiocyanate
Unit Cell:
a: 92.136 Å b: 92.136 Å c: 78.52 Å α: 90° β: 90° γ: 90°
Symmetry:
Space Group: P 42 2 2
Crystal Properties:
Matthew's Coefficient: 3.36 Solvent Content: 63.35
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.388 19.93 56516 2886 82.4 0.1627 0.1726 19.51
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.388 92.136 96.1 0.125 ? 21.6 46.4 ? 56552 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.388 1.467 71.7 ? ? 1.7 26.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON AUSTRALIAN SYNCHROTRON BEAMLINE MX2 0.95374 Australian Synchrotron MX2
Software
Software Name Purpose Version
BUSTER refinement 2.10.4
XDS data reduction .
Aimless data scaling .
PHASER phasing .
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