X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 289 0.1 M Sodium Citrate pH 5.6, 20 % (w/v) PEG 4000, 20 % (v/v) 2-propanol
Unit Cell:
a: 71.310 Å b: 78.500 Å c: 127.150 Å α: 97.600° β: 89.960° γ: 90.020°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.85 Solvent Content: 56.88
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.90 39.20 55403 2925 91.47 0.2640 0.2919 119.38
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.90 39.2 91.6 0.085 ? 8.6 3.1 ? 55485 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.90 2.95 92.2 ? ? 0.9 3.1 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97911 APS 19-ID
Software
Software Name Purpose Version
PHENIX refinement 1.19_4092
xia2 data reduction .
HKL-3000 data scaling .
HKL-3000 phasing .
MOLREP phasing .
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