ELECTRON MICROSCOPY

Sample

13pf E254A microtubule decorated with EB3

Specimen Preperation
Sample Aggregation State HELICAL ARRAY
Vitrification Instrument ?
Cryogen Name ETHANE-PROPANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method HELICAL
Number of Particles 10008
Reported Resolution (Å) 3.8
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type HELICAL
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol RIGID BODY FIT
Refinement Target Correlation Coefficient
Overall B Value 115
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 40
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 500
Maximum Defocus (nm) 2500
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.6
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 64000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION CTFFIND 4
CTF CORRECTION RELION 3.1
MODEL FITTING PHENIX dev-2883
INITIAL EULER ASSIGNMENT RELION 3.1
FINAL EULER ASSIGNMENT FREALIGN 9.11
CLASSIFICATION RELION 3.1
RECONSTRUCTION FREALIGN 9.11
MODEL REFINEMENT PHENIX dev-2883
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION CTFFind4 and CTFRefine were used within the RELION3.1 framework.