X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 290 CdSO4, NH4SO4, Tris pH 7.4
Unit Cell:
a: 181.507 Å b: 181.507 Å c: 181.507 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: F 4 3 2
Crystal Properties:
Matthew's Coefficient: 3.13 Solvent Content: 60.76
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.0900 28.7000 15629 813 99.9400 0.1713 0.1958 30.9457
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.09 28.70 99.8 0.112 ? 0.935 20 ? 15632 ? ? 28.340
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.09 2.15 ? ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 19-ID 0.979 NSLS-II 19-ID
Software
Software Name Purpose Version
PHENIX refinement 1.19_4092
Aimless data scaling .
PDB_EXTRACT data extraction 3.27
XDS data reduction .
PHASER phasing .
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