X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 292 Cocrystal with 1.2M Ammonium Sulfate, Na. Aceteate pH5. Shifted to 1.5 M Ammonium sulfate 0.1M Hepes 7.4, 20% glycerol prior to paratone and freezing.
Unit Cell:
a: 30.702 Å b: 72.781 Å c: 55.514 Å α: 90.000° β: 106.380° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.04 Solvent Content: 39.81
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.2500 30.0500 31913 1619 98.8300 0.1204 0.1474 20.7798
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.25 53.261 99.000 ? 0.041 16.200 4.300 ? 31926 ? ? 12.730
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.25 1.320 98.000 ? 0.492 1.500 4.300 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID 1.000 APS 17-ID
Software
Software Name Purpose Version
SCALA data scaling 3.3.16
PHENIX refinement 1.19.1_4122
PDB_EXTRACT data extraction 3.27
XDS data reduction .
PHASER phasing .
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