X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 3.50 295 25 % PEG 3350, 100 mM CITRIC ACID PH 3.5, 1 mM TCEP, 39 mM O-PHOSPHO-L-SERINE OR 39 mM SERINE, VAPOR
Unit Cell:
a: 94.670 Å b: 64.550 Å c: 42.630 Å α: 90.000° β: 113.260° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.010 Solvent Content: 38.660
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS THROUGHOUT 1.2700 37.3500 62038 2308 99.9000 0.1320 0.1550 18.8979
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.270 37.350 100.000 ? 0.168 8.700 10.000 62064 62064 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.270 1.320 99.900 ? 0.114 5.000 11.500 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80.000 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 5.0.2 1.0, 0.9795 ALS 5.0.2
Software
Software Name Purpose Version
SCALA data scaling 3.3.22
PHENIX refinement 1.9_1692
PDB_EXTRACT data extraction 3.25
HKL-2000 data reduction .
AutoSol phasing .