ISDA: 7R9X

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	?	277.15	AmbE_Cd crystallized at a concentration of 10mg/ml in conditions containing 100mM bis-Tris propane (pH 6.0), 20% PEG3350 and 0.2M sodium iodide. Cryoprotection was performed by dipping the crystal in a solution containing 20% MPD (hexylene glycol), 0.2M NaCl, 50mM Tris-Cl (pH7.5), 0.2M sodium iodide, 20% PEG 3350 and 100mM bis-Tris propane (pH 6.0) before being flash frozen in liquid nitrogen.

Unit Cell:

a: 89.940 Å b: 106.870 Å c: 108.909 Å α: 90.000° β: 96.252° γ: 90.000°

Symmetry:

Space Group: I 1 2 1

Crystal Properties:

Matthew's Coefficient: 2.71 Solvent Content: 54.62

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	2.14	44.70	55789	2000	99.13	0.1912	0.2323	34.19

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.14	76.06	99.2	?	?	16.2	3.3	?	55789	?	?	27.49

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.14	2.20	?	?	?	4.1	?	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 24-ID-E	0.979	APS	24-ID-E

Software