X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 295 1 M succinic acid, pH 7.0, 0.02% w/v 4-Aminobenzioc acid, 0.02% w/v Azelaic acid, 0.02% w/v o-Sulfobenzoic acid monoammonium salt, 0.02% w/v Sodium 4-aminosalicylate dehydrate, 0.002 M HEPES sodium pH 6.8
Unit Cell:
a: 63.468 Å b: 95.315 Å c: 69.682 Å α: 90.000° β: 105.390° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.68 Solvent Content: 54.06
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.6500 38.8710 94067 1998 98.1100 0.1656 0.1945 30.2624
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.650 40.240 98.200 0.081 ? 10.700 4.600 ? 94133 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.650 1.680 98.500 ? ? ? 4.600 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL12-2 0.97946 SSRL BL12-2
Software
Software Name Purpose Version
Aimless data scaling 0.7.4
PHENIX refinement 1.14_3260
PDB_EXTRACT data extraction 3.25
XDS data reduction .
PHASER phasing .