ISDA: 7R0X

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.5	293.1	1.809M ammonium sulfate, 100mM HEPES pH 7.5, 4.14% PEG 8K (w/v), 3.95% PEG400 (v/v)

Unit Cell:

a: 106.818 Å b: 106.818 Å c: 78.140 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: I 4

Crystal Properties:

Matthew's Coefficient: 2.71 Solvent Content: 54.69

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	FREE R-VALUE	2.83	40.76	20593	2041	99.83	0.2293	0.2805	69.38

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.83	40.76	99.9	?	?	12.3	13.7	?	144817	?	?	64.40

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.83	2.93	99.9	?	?	1.06	13.5	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		120 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SLS BEAMLINE X06DA	0.979	SLS	X06DA

Software