ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	4.6	293	0.2M (NH4)SO4, 0.1M Na acetate pH 4.6, 28% (v/v) PEG MME 550, 2.8% (v/v) tert-Butanol

Unit Cell:

a: 164.320 Å b: 164.320 Å c: 164.320 Å α: 90.000° β: 90.000° γ: 90.000°

Symmetry:

Space Group: P 41 3 2

Crystal Properties:

Matthew's Coefficient: 3.01 Solvent Content: 59.19

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.7000	49.5400	21399	1071	99.9000	0.1910	0.2490	85.1400

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.70	49.560	100	0.244	?	13.800	32.9	?	21401	?	?	101.650

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.70	2.83	100.000	?	?	?	30	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SOLEIL BEAMLINE PROXIMA 1	1.07197	SOLEIL	PROXIMA 1

Software