X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 277.15 10% PEG 3350, 0.1M sodium sulfate, 0.1M citrate 4.6
Unit Cell:
a: 49.438 Å b: 85.240 Å c: 89.678 Å α: 70.270° β: 74.100° γ: 86.860°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.48 Solvent Content: 50.45
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.3000 70.0300 52393 2609 93.4900 0.2544 0.3051 35.5290
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 70.03 94.000 0.118 ? 5.400 2.900 ? 55296 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.300 2.420 96.800 ? ? 2.1 2.900 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.0000 SLS X06DA
Software
Software Name Purpose Version
Aimless data scaling 0.7.1
REFMAC refinement 5.8.0230
PDB_EXTRACT data extraction 3.27
XDS data reduction .
PHASER phasing .