X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277.17 50 mM MgAc, 50 mM HEPES pH 7.2-7.6 and 25-30% PEG400 and crystals soaked in 25mM MnAc
Unit Cell:
a: 92.900 Å b: 115.930 Å c: 148.660 Å α: 90.000° β: 107.590° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.59 Solvent Content: 52.49
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 4.60 12.00 15762 788 99.02 0.2863 0.3274 270.79
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
4.6 12 99.7 ? ? 11.42 14.0 ? 32816 ? ? 189.78
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 4.6 4.7 ? ? ? 1.85 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 80 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 1.892738 SLS X06DA
Software
Software Name Purpose Version
PHENIX phasing 1.20_4459
PHENIX refinement 1.20_4459
Coot model building 0.9.6
XDS data reduction Version Feb5, 2021
XSCALE data scaling Version Feb5, 2021