ELECTRON MICROSCOPY

Sample

TnpA-IR71st complex

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument ?
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 139519
Reported Resolution (Å) 3.0
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol AB INITIO MODEL
Refinement Target correlation coefficient
Overall B Value 167.8
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 62
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model JEOL CRYO ARM 300
Minimum Defocus (nm) 400
Maximum Defocus (nm) 3200
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model JEOL CRYOSPECPORTER
Nominal Magnification ?
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cryoSPARC 3.1.0
IMAGE ACQUISITION SerialEM 3.0.8
CTF CORRECTION CTFFIND 4
MODEL FITTING Coot 0.9.5
INITIAL EULER ASSIGNMENT RELION 3.1.2
FINAL EULER ASSIGNMENT RELION 3.1.2
CLASSIFICATION RELION 3.1.0
RECONSTRUCTION RELION 3.1.2
MODEL REFINEMENT PHENIX 1.19.1
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?