X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 294.15 25.236 % v/v PEG 400, 2 % v/v 2 propanol, 0.17 M MgCl2, 0.04 M CaAc2, 0.08 M Tris/HCl pH 8.5, 0.02 M MES/NaOH pH 6.0
Unit Cell:
a: 48.503 Å b: 109.628 Å c: 92.490 Å α: 90.000° β: 102.140° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.83 Solvent Content: 56.48
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.3100 47.4200 14058 701 99.0600 0.2322 0.2686 57.1669
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.310 109.760 99.400 0.297 ? 5.900 6.900 ? 14187 ? ? 59.640
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.310 3.400 99.000 ? ? ? 6.400 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I03 0.97625 Diamond I03
Software
Software Name Purpose Version
PHENIX refinement 1.20rc1_4392
REFMAC refinement 5.8.0230
Aimless data scaling 0.7.4
PDB_EXTRACT data extraction 3.27
XDS data reduction .
PHASER phasing .
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