X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293.15 0.2 M Lithium sulfate 0.1 M Bis-Tris pH 5.5 25 % PEG 3350
Unit Cell:
a: 97.749 Å b: 99.893 Å c: 106.182 Å α: 77.67° β: 75.19° γ: 67.12°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.12 Solvent Content: 42.02
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.989 20.03 153157 7387 62.9 0.1942 0.2319 24.99
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.989 48.148 87.49 0.304 ? 3.195 2.91 ? 153369 ? 1.2 22.25
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.989 2.170 70.72 ? ? ? 3.23 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID30B 0.918401 ESRF ID30B
Software
Software Name Purpose Version
BUSTER refinement 2.10.4
XDS data reduction .
XSCALE data scaling .
PHASER phasing .