X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293.15 0.2 M lithium sulfate 0.1 M Bis-Tris pH 6.5 18 % PEG 3350
Unit Cell:
a: 97.665 Å b: 126.036 Å c: 148.393 Å α: 96.36° β: 104.81° γ: 84.23°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.03 Solvent Content: 39.31
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.5 19.97 744550 18412 68.6 0.2007 0.2316 16.85
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.499 47.634 89.97 0.122 ? 5.444 2.76 ? 744804 1.2 ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.499 1.635 63.75 ? ? 1.569 2.89 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ESRF BEAMLINE ID23-2 0.873128 ESRF ID23-2
Software
Software Name Purpose Version
BUSTER refinement 2.10.4
XDS data reduction .
XSCALE data scaling .
PHASER phasing .
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