X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293.15 100 mM potassium phosphate monohydrate / potassium phosphate dihydrate pH 6.0, 10% (w/v) PEG 8000, 686 mM NaCl
Unit Cell:
a: 96.090 Å b: 96.110 Å c: 190.410 Å α: 100.913° β: 93.012° γ: 113.835°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.74 Solvent Content: 55.12
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.900 47.809 465782 23290 97.590 ? 0.2164 36.130
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.90 48.5 89.9 ? ? 9.27 3.83 ? 465782 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.90 2.01 ? ? ? 1.15 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 93 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 0.99 SLS X06SA
Software
Software Name Purpose Version
REFMAC refinement 5.8.0258
XDS data reduction .
XDS data scaling .
PHASER phasing .
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