X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.25 293 PEG6000, LiCl, MES/NaOH
Unit Cell:
a: 95.902 Å b: 101.596 Å c: 102.755 Å α: 83.920° β: 73.640° γ: 77.710°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.640 Solvent Content: 53.500
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.0000 99.1500 68421 513 94.8100 0.1859 0.2879 94.2610
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.000 99.150 94.700 0.068 ? 9.700 1.700 ? 68934 ? ? 76.282
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.000 3.25 93.700 ? ? 0.9 1.600 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.000 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 0.99998 SLS X10SA
Software
Software Name Purpose Version
XSCALE data scaling .
REFMAC refinement 5.8.0155
PDB_EXTRACT data extraction 3.27
XDS data reduction .
MOLREP phasing .
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