ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7	277	Annealing: 200 uM L-[Ru(phen)2(Aqphen)]2+, 200 uM GGGTTAGGGTTAGGGTTTGGG, and 10 mM KCl. Crystallisation: 100 uM L-[Ru(phen)2(Aqphen)]2+, 100 uM GGGTTAGGGTTAGGGTTTGGG, 5 mM KCl, 40 mM NaCl, 20 mM Na Cacodylate pH 7.0, 20% v/v MPD, 6 mM spermine hydrochloride, and 10 mM BaCl2.

Unit Cell:

a: 29.680 Å b: 29.680 Å c: 113.980 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 32 2 1

Crystal Properties:

Matthew's Coefficient: 2.2 Solvent Content: 38

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	THROUGHOUT	1.6000	21.2900	14787	1471	99.8200	0.1663	0.1810	30.1717

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.6	21.29	99.70	0.1006	?	14.35	17	?	140815	?	?	22.39

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.6	1.657	98.15	?	?	2.39	11.8	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	DIAMOND BEAMLINE I03	0.5604, 1.7712	Diamond	I03

Software