ELECTRON MICROSCOPY

Sample

70S-CspA70-2

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument ?
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 23782
Reported Resolution (Å) 3
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol OTHER
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details The software LocScale for model-based local density sharpening was used as implemented in the CCP-EM suite, version 1.3.0
Data Acquisition
Detector Type FEI FALCON III (4k x 4k)
Electron Dose (electrons/Å2) 2.2
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 500
Maximum Defocus (nm) 2200
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 75000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION Gautomatch 0.53
IMAGE ACQUISITION EPU ?
CTF CORRECTION Gctf 1.06
CTF CORRECTION RELION 3.07
MODEL FITTING UCSF Chimera 1.13.1
MODEL FITTING Coot 0.9
INITIAL EULER ASSIGNMENT RELION 3.07
FINAL EULER ASSIGNMENT RELION 3.07
CLASSIFICATION RELION 3.07
RECONSTRUCTION RELION 3.07
MODEL REFINEMENT PHENIX 1.18
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
NONE ?