ISDA: 7ODX

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.0	277.15	15% v/v Tacsimate; 2% w/v PEG 3350; 100 mM HEPES pH 7

Unit Cell:

a: 108.180 Å b: 108.180 Å c: 142.330 Å α: 90.000° β: 90.000° γ: 120.000°

Symmetry:

Space Group: P 62 2 2

Crystal Properties:

Matthew's Coefficient: 3.01 Solvent Content: 59.18

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	1.69617086092	44.4954227156	54761	2738	99.7104879825	0.160215360219	0.17601031371	32.2959699757

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
1.69617086092	44.50	99.8	0.081	?	34.1	39.6	?	54836	?	?	28.6904003452

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	1.70	1.74	98.0	?	?	1.7	39.4	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SOLEIL BEAMLINE PROXIMA 2	0.980130	SOLEIL	PROXIMA 2

Software