X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 295 0.03 M Sodium nitrate, 0.03 M Sodium phosphatedibasic 0.03 M Ammonium sulfate 0.1 M HEPES, 0.1 M MOPS pH 7.5 20% v/v PEG 500 MME; 10% w/v PEG 20000
Unit Cell:
a: 43.294 Å b: 43.294 Å c: 158.181 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 65
Crystal Properties:
Matthew's Coefficient: 2.34 Solvent Content: 47.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.82 36.48 14245 778 95.02 0.1838 0.2098 31.77
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.82 37.49 95.02 ? ? 38.78 17.9 ? 14314 ? ? 24.56
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.82 1.885 ? ? ? 0.56 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 1.28 SLS X10SA
Software
Software Name Purpose Version
PHENIX refinement 1.19.1-4122
xia2 data reduction .
Aimless data scaling .
Coot model building .
PHASER phasing .