X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 289 0.2 M sodium bromide, 0.1 M Tris, pH 7.5, 25% PEG3350
Unit Cell:
a: 35.479 Å b: 36.366 Å c: 176.377 Å α: 90.000° β: 90.000° γ: 90.000°
Symmetry:
Space Group: P 2 2 21
Crystal Properties:
Matthew's Coefficient: 2.20 Solvent Content: 44.18
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.90 36.37 5418 269 97.43 0.2498 0.3093 111.97
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.89 36.37 99.3 0.222 ? 24.7 41.3 ? 5536 ? ? 96.23
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.89 2.99 97.0 ? ? 2.1 17.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-ID 1.00000 APS 22-ID
Software
Software Name Purpose Version
SERGUI data collection .
PHENIX refinement 1.19.1_4122
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing .