ELECTRON MICROSCOPY

Sample

Complex of NHP-isolated Ab1245 Fab and bNAb 8ANC195 G52K5 Fab bound to BG505 SOSIP.664 trimer

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details 0 blot force, 3 second blot time, 3 uL sample added
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 172731
Reported Resolution (Å) 3.7
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space ?
Refinement Protocol RIGID BODY FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K3 (6k x 4k)
Electron Dose (electrons/Å2) 60
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) 800
Maximum Defocus (nm) 2500
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS ?
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 105000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION Gctf ?
MODEL FITTING UCSF Chimera ?
INITIAL EULER ASSIGNMENT RELION ?
FINAL EULER ASSIGNMENT RELION ?
CLASSIFICATION RELION ?
RECONSTRUCTION RELION ?
MODEL REFINEMENT PHENIX ?
MODEL REFINEMENT Coot ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?