X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.2M Sodium Iodide, 20% PEG3350
Unit Cell:
a: 61.315 Å b: 73.454 Å c: 74.149 Å α: 108.396° β: 106.702° γ: 110.152°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.94 Solvent Content: 58.11
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 2.56 51.56 32553 1666 97.78 0.2353 0.2702 75.60
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.56 51.56 97.9 ? ? 4.7 2.3 ? 32600 ? ? 58.44
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.56 2.65 93.4 ? ? 1.1 2.4 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.1 0.99991 ALS 8.2.1
Software
Software Name Purpose Version
PHENIX refinement 1.19.1_4122
Adxv data collection .
DIALS data scaling .
PHASER phasing .
DIALS data reduction .
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