X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 287 Rigaku Reagents JCSG TOP96 screen, condition #61/F1: 20% PEG 3350, 200mM Ammonium formate: ElanA.00047.b.B1.PS38159 at 25mg/ml: tray 318833 F1: cryo: 20% EG: puck NDH4-7.
Unit Cell:
a: 59.760 Å b: 92.650 Å c: 98.430 Å α: 116.151° β: 107.668° γ: 90.032°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.23 Solvent Content: 44.9
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.25 35.94 465896 10052 94.39 0.1245 0.1472 16.35
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.250 50 94.200 0.038 ? 20.170 3.876 ? 465944 ? ? 14.920
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.250 1.280 90.600 ? ? 4.320 3.330 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-G 0.97856 APS 21-ID-G
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling .
PHENIX refinement dev_4205
PDB_EXTRACT data extraction 3.27
MoRDa phasing .
ARP/wARP model building .
PHENIX model building .
Coot model building .
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