X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 0.1 M citric acid, 2.394 M ammonium sulfate
Unit Cell:
a: 90.425 Å b: 90.425 Å c: 208.471 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 63 2 2
Crystal Properties:
Matthew's Coefficient: 4.26 Solvent Content: 71.12
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.0530 38.4820 32328 2000 99.8400 0.1978 0.2210 48.1747
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.05 39.1 99.8 ? ? 12.06 11.1 ? 59466 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.05 2.11 ? ? ? 1.77 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F .97872 APS 21-ID-F
Software
Software Name Purpose Version
PHENIX refinement 1.14_3260
PDB_EXTRACT data extraction 3.27
XDS data reduction .
XDS data scaling .
PHENIX phasing .