X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 279 Crystals grown by vapor diffusion as sitting drops. Drops were equal volumes of a 6 mg/ml STMV stock solution buffered at pH 6.5 with 0.1 M phosphate. The reservoirs were 16% saturated ammonium sulfate in 0.1 M phosphate at pH 6.5. Drops were 6 to 8 ul with 0.60 ml reservoirs. Crystals were grown at 4 degrees C over a weeks time.
Unit Cell:
a: 175.760 Å b: 169.860 Å c: 244.560 Å α: 90.000° β: 92.690° γ: 90.000°
Symmetry:
Space Group: I 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.74 Solvent Content: 29.43
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.7100 49.9500 179135 8864 91.7900 0.1316 0.1767 25.2683
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.7 49.95 91.8 0.0691 0.0675 9.27 8.2 ? 179156 ? 2.0 20.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.7 2.8 58.8 ? 0.127 5.7 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU 1.54 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.19_4092
PDB_EXTRACT data extraction 3.27
SDMS data reduction .
Aimless data scaling .
PHASER phasing .