X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 287 Microlytics MCSG1 screen, condition C9: 32% w/V PEG4000, 800 mM lithium chloride, 100 mM Tris base/HCl, pH 8.50: MytuD.00149.b.B1.PW38903, tray 318922c9, crystal soaked for 6 hours in reservoir with 5 mM SAH, cryoprotectant: 20% ethylene glycol + soak buffer, puck xeo4-1.
Unit Cell:
a: 103.220 Å b: 103.220 Å c: 49.150 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 32 2 1
Crystal Properties:
Matthew's Coefficient: 2.22 Solvent Content: 44.51
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.95 43.07 22240 2062 99.92 0.1683 0.1961 35.99
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.950 50 99.900 0.053 ? 26.410 9.368 ? 22257 ? ? 36.706
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.950 2.000 100.000 ? ? 2.630 5.417 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E+ SUPERBRIGHT 1.5418 ? ?
Software
Software Name Purpose Version
XDS data reduction .
XSCALE data scaling .
PHENIX refinement 1.19
PDB_EXTRACT data extraction 3.27
PHASER phasing .
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