ELECTRON MICROSCOPY

Sample

Long-range synaptic Complex of NHEJ

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details ?
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 329784
Reported Resolution (Å) 4.6
Resolution Method FSC 0.143 CUT-OFF
Other Details ?
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target Correlation coefficient
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 SUMMIT (4k x 4k)
Electron Dose (electrons/Å2) 76.5
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model JEOL 3200FS
Minimum Defocus (nm) 2000
Maximum Defocus (nm) 4000
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode DARK FIELD
Specimen Holder Model JEOL
Nominal Magnification 30000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 200
Imaging Details ?
Imaging Experiment
Task Software Package Version
IMAGE ACQUISITION Appion ?
IMAGE ACQUISITION RELION 3.1
CTF CORRECTION Gctf 0.50
CTF CORRECTION CTFFIND 4.1
MODEL FITTING Coot ?
MODEL FITTING ISOLDE ?
INITIAL EULER ASSIGNMENT EMAN ?
INITIAL EULER ASSIGNMENT cryoSPARC ?
FINAL EULER ASSIGNMENT RELION 3.1
CLASSIFICATION RELION 3.1
RECONSTRUCTION RELION 3.1
MODEL REFINEMENT PHENIX ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
NONE ?