7LRH

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.2 294 12% (w/v) PEG 8000 + 0.1 M MES pH 6,2 + 0.2 M ammonium sulfate
Unit Cell:
a: 54.910 Å b: 56.700 Å c: 79.600 Å α: 95.988° β: 91.249° γ: 113.164°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.34 Solvent Content: 47.33
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.92 50.36 65607 3274 97.97 0.2361 0.2741 56.94
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.92 50.36 98.1 0.085 ? 12.1 11.8 ? 65607 ? ? 46.03
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.92 1.97 96.9 ? ? 1.0 12.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 2 0.9801 SOLEIL PROXIMA 2
Software
Software Name Purpose Version
MxCuBE data collection .
XDS data reduction .
Aimless data scaling .
BALBES phasing .
PHENIX refinement 1.17.1_3660
REFMAC refinement (from ARP/wARP)
Coot model building .
ARP/wARP model building .