X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 291 2 % w/v Tasciminate pH 5.0, 0.1 M Sodium Citrate tribasic pH 5.6, 16 % PEG 3350 with 0.1 M Strontium Chloride. 6H2O as additive
Unit Cell:
a: 103.405 Å b: 144.300 Å c: 131.143 Å α: 90.000° β: 92.070° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.35 Solvent Content: 51.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.0000 47.4900 76519 3814 99.3700 0.1959 0.2420 45.5616
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.000 48.670 99.500 0.170 ? 6.400 3.400 ? 76608 ? ? 46.110
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.000 3.060 99.400 ? ? ? 3.400 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SOLEIL BEAMLINE PROXIMA 1 0.9786 SOLEIL PROXIMA 1
Software
Software Name Purpose Version
XDS data reduction VERSION Jan 26, 2018
Aimless data scaling 0.6.3
PHENIX refinement 1.19
PDB_EXTRACT data extraction 3.27
PHENIX phasing 1.19