X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 293 50 mM Bis-Tris pH 7.0, 25 mM NaCl, 25 mM LiCl, 4.5 mM CaCl2, 50 mM Guanidine HCl, 23.75% polyethylene glycol 2000
Unit Cell:
a: 65.93 Å b: 49.67 Å c: 73.46 Å α: 90° β: 99.741° γ: 90°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.06 Solvent Content: 40.17
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.1 44.74 27604 3809 98.01 0.2298 0.2585 38.6332
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.1 44.74 99.81 0.1303 ? 17.95 10.9 ? 27633 ? ? 34.69
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.1 2.175 99.89 ? ? 3.17 10.0 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 4.2.2 1.10208 ALS 4.2.2
Software
Software Name Purpose Version
XSCALE data scaling .
PHENIX refinement Phenixdev-3758
PDB_EXTRACT data extraction 3.25
XDS data reduction .
PHENIX phasing .