ISDA: 7KDN

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8.5	287	RigakuReagents Morpheus screen, g9:10% w/v PEG 20000, 20% v/v PEG MME 550, 0.02M carboxylic acids (sodium formate, ammonium acetate, trisodium citrate,sodium potassium L-tartrate, sodium oxamate, 0.1M bicine/Trizma base pH8.5; AsfuA.00629.a.FS11.PD00486 at 10 mg/ml, 1mM TCEP, 1mM BSI5663/Propyl-AMP; cryo: direct; tray 313288g9, puck ejj3-5

Unit Cell:

a: 103.790 Å b: 104.210 Å c: 125.650 Å α: 68.150° β: 66.550° γ: 62.220°

Symmetry:

Space Group: P 1

Crystal Properties:

Matthew's Coefficient: 2.34 Solvent Content: 47.58

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	FREE R-VALUE	2.8000	47.9200	100431	1999	98.0600	0.2161	0.2462	65.7636

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.800	50.0	97.900	0.120	?	10.140	3.9	?	100485	?	-3.000	57.775

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.800	2.870	97.500	?	?	1.570	4.0	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K			?

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-F	0.97872	APS	21-ID-F

Software