X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 291 14% PEG 10,000, 1% dioxane, 0.1 M amonium acetate, 0.1 M BIS-TRIS pH 5.5
Unit Cell:
a: 107.223 Å b: 107.383 Å c: 132.533 Å α: 99.030° β: 113.380° γ: 108.450°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.30 Solvent Content: 62.75
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.48 49.20 166046 8302 96.0300 0.2480 0.2783 85.8800
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.48 49.20 95.900 0.065 ? 12.370 3.241 ? 166175 ? ? 53.840
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.480 2.630 92.800 ? ? 1.060 3.315 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON LNLS BEAMLINE W01B-MX2 1.459 LNLS W01B-MX2
Software
Software Name Purpose Version
PHENIX refinement 1.8
XDS data reduction .
XSCALE data scaling .
PDB_EXTRACT data extraction 3.25
SHELXDE phasing .