ELECTRON MICROSCOPY

Sample

TRPA1 bound by antagonist compound 21

Specimen Preperation
Sample Aggregation State PARTICLE
Vitrification Instrument FEI VITROBOT MARK IV
Cryogen Name ETHANE
Sample Vitrification Details Triple blot. Put blot in vitroblot Apply 3.5ul to grid, wait 30sec, blot manually Apply 3.5ul to grid, wait 30sec, blot manually, apply final 3.5ul, final blot by vitrobot (3.5s)
3D Reconstruction
Reconstruction Method SINGLE PARTICLE
Number of Particles 101265
Reported Resolution (Å) 3.05
Resolution Method FSC 0.143 CUT-OFF
Other Details No data beyond 4.4 A were used during refinement.
Refinement Type
Symmetry Type POINT
Map-Model Fitting and Refinement
ID 1
Refinement Space REAL
Refinement Protocol FLEXIBLE FIT
Refinement Target ?
Overall B Value ?
Fitting Procedure ?
Details ?
Data Acquisition
Detector Type GATAN K2 QUANTUM (4k x 4k)
Electron Dose (electrons/Å2) 41.8
Imaging Experiment
Date of Experiment ?
Temprature (Kelvin)
Microscope Model FEI TITAN KRIOS
Minimum Defocus (nm) ?
Maximum Defocus (nm) ?
Minimum Tilt Angle (degrees) ?
Maximum Tilt Angle (degrees) ?
Nominal CS 2.7
Imaging Mode BRIGHT FIELD
Specimen Holder Model FEI TITAN KRIOS AUTOGRID HOLDER
Nominal Magnification 165000
Calibrated Magnification ?
Source FIELD EMISSION GUN
Acceleration Voltage (kV) 300
Imaging Details ?
Imaging Experiment
Task Software Package Version
PARTICLE SELECTION cisTEM 1.0
IMAGE ACQUISITION SerialEM ?
CTF CORRECTION cisTEM ?
MODEL FITTING Coot ?
MODEL FITTING ISOLDE ?
INITIAL EULER ASSIGNMENT cisTEM ?
FINAL EULER ASSIGNMENT cisTEM ?
CLASSIFICATION cisTEM ?
RECONSTRUCTION cisTEM ?
RECONSTRUCTION PHENIX ?
MODEL REFINEMENT PHENIX ?
MODEL REFINEMENT Coot ?
Image Processing
CTF Correction Type CTF Correction Details Number of Particles Selected Particle Selection Details
PHASE FLIPPING AND AMPLITUDE CORRECTION ?