X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 24% PEG-1000, 100 mM Tris-HCl (pH 7.0), 2 mM IAA, and 5 mM NAD+
Unit Cell:
a: 333.816 Å b: 161.095 Å c: 84.999 Å α: 90.000° β: 90.010° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.71 Solvent Content: 54.58
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.8480 47.8880 103193 1998 98.2800 0.2170 0.2544 36.3547
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.8480 47.9 98.3 0.092 ? 13.9 5.4 ? 103830 ? ? 22.23
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.8480 2.9200 99.8 ? .241 5.4 6.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.98 APS 19-ID
Software
Software Name Purpose Version
PHENIX refinement 1.13_2998
PDB_EXTRACT data extraction 3.25
HKL-3000 data reduction .
HKL-3000 data scaling .
HKL-3000 phasing .