X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 295 20 mM MgCl2, 0.3 mM spermine tetrahydrochloride, 50 mM sodium succinate pH 5.5, 3.0 M Ammonium Sulfate
Unit Cell:
a: 60.623 Å b: 64.795 Å c: 69.578 Å α: 85.700° β: 64.250° γ: 79.910°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.89 Solvent Content: 57.47
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.2100 38.2890 15105 1517 98.4500 0.2768 0.2966 151.8488
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.21 50 97.8 0.069 ? 29.6 3.7 ? 15105 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.21 3.27 95.9 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.979180 APS 24-ID-E
Software
Software Name Purpose Version
PHENIX refinement 1.11.1_2575
PDB_EXTRACT data extraction 3.25
HKL-2000 data reduction 718
HKL-2000 data scaling 718
PHENIX phasing 1.11.1_2575
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