X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 295 0.1 M succinic acid, 15% w/v PEG 3350
Unit Cell:
a: 119.242 Å b: 119.135 Å c: 382.903 Å α: 89.840° β: 90.000° γ: 119.960°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.36 Solvent Content: 63.36
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.95 10.0000 142947 7322 95.1100 0.2610 0.2914 124.0922
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.95 15 94.0 ? 0.215 3.2 1.6 ? 150584 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.95 4.13 93 ? ? 1.2 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 23-ID-D 1.035 APS 23-ID-D
Software
Software Name Purpose Version
PHENIX refinement 1.18.2-3874
HKL-2000 data reduction .
SCALEPACK data scaling .
PHASER phasing .
PDB_EXTRACT data extraction 3.25
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