X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.6 298 25.5% (w/v) PEG 4000, 0.17M ammonium acetate, 0.085M sodium citrate HCl, pH 5.6, with 15% (v/v) glycerol
Unit Cell:
a: 62.365 Å b: 75.930 Å c: 64.003 Å α: 90.000° β: 90.814° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.49 Solvent Content: 50.7
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT FREE R-VALUE 1.78 29.49 53578 1999 94.14 0.1833 0.2103 32.06
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.78 29.49 94.12 .0255 ? 16.21 1.9 ? 53611 ? ? 25.58
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.783 1.847 65.64 ? ? 1.52 1.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS-II BEAMLINE 17-ID-1 .91942 NSLS-II 17-ID-1
Software
Software Name Purpose Version
PHENIX model building 1.18.2_3874
PHENIX refinement 1.18.2_3874
PDB_EXTRACT data extraction 1.18.2_3874
DIALS data reduction .
XDS data scaling .
PHASER phasing .